Cover of Electron Beam Testing Technology

Book 1993

Electron Beam Testing Technology

Publisher
Springer US
Language
English
Published
1993
  • Computer engineering
  • Condensed Matter Physics
  • Spectroscopy and Microscopy
  • Optical and Electronic Materials
  • Optical materials
  • Solid State Physics
  • Electrical Engineering
  • Crystallography

This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.