Book 1993
Electron Beam Testing Technology
- Publisher
- Springer US
- Language
- English
- Published
- 1993
- Computer engineering
- Condensed Matter Physics
- Spectroscopy and Microscopy
- Optical and Electronic Materials
- Optical materials
- Solid State Physics
- Electrical Engineering
- Crystallography
This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.